The failure of mbedtls_md was not checked in one place. This could have led
to an incorrect computation if a hardware accelerator failed. In most cases
this would have led to the key exchange failing, so the impact would have been
a hard-to-diagnose error reported in the wrong place. If the two sides of the
key exchange failed in the same way with an output from mbedtls_md that was
independent of the input, this could have led to an apparently successful key
exchange with a predictable key, thus a glitching md accelerator could have
caused a security vulnerability.
* restricted/pr/582:
Add a test for signing content with a long ECDSA key
Add documentation notes about the required size of the signature buffers
Add missing MBEDTLS_ECP_C dependencies in check_config.h
Change size of preallocated buffer for pk_sign() calls
* origin/pr/2714:
programs: Make `make clean` clean all programs always
ssl_tls: Enable Suite B with subset of ECP curves
windows: Fix Release x64 configuration
timing: Remove redundant include file
net_sockets: Fix typo in net_would_block()
* origin/pr/2701:
Add all.sh component that exercises invalid_param checks
Remove mbedtls_param_failed from programs
Make it easier to define MBEDTLS_PARAM_FAILED as assert
Make test suites compatible with #include <assert.h>
Pass -m32 to the linker as well
Introduce a new configuration option MBEDTLS_CHECK_PARAMS_ASSERT,
which is disabled by default. When this option is enabled,
MBEDTLS_PARAM_FAILED defaults to assert rather than to a call to
mbedtls_param_failed, and <assert.h> is included.
This fixes#2671 (no easy way to make MBEDTLS_PARAM_FAILED assert)
without breaking backward compatibility. With this change,
`config.pl full` runs tests with MBEDTLS_PARAM_FAILED set to assert,
so the tests will fail if a validation check fails, and programs don't
need to provide their own definition of mbedtls_param_failed().
- Explain the use of explicit ASN.1 tagging for the extensions structuree
- Remove misleading comment which suggests that mbedtls_x509_get_ext()
also parsed the header of the first extension, which is not the case.
Some functions within the X.509 module return an ASN.1 low level
error code where instead this error code should be wrapped by a
high-level X.509 error code as in the bulk of the module.
Specifically, the following functions are affected:
- mbedtls_x509_get_ext()
- x509_get_version()
- x509_get_uid()
This commit modifies these functions to always return an
X.509 high level error code.
Care has to be taken when adapting `mbetls_x509_get_ext()`:
Currently, the callers `mbedtls_x509_crt_ext()` treat the
return code `MBEDTLS_ERR_ASN1_UNEXPECTED_TAG` specially to
gracefully detect and continue if the extension structure is not
present. Wrapping the ASN.1 error with
`MBEDTLS_ERR_X509_INVALID_EXTENSIONS` and adapting the check
accordingly would mean that an unexpected tag somewhere
down the extension parsing would be ignored by the caller.
The way out of this is the following: Luckily, the extension
structure is always the last field in the surrounding structure,
so if there is some data remaining, it must be an Extension
structure, so we don't need to deal with a tag mismatch gracefully
in the first place.
We may therefore wrap the return code from the initial call to
`mbedtls_asn1_get_tag()` in `mbedtls_x509_get_ext()` by
`MBEDTLS_ERR_X509_INVALID_EXTENSIONS` and simply remove
the special treatment of `MBEDTLS_ERR_ASN1_UNEXPECTED_TAG`
in the callers `x509_crl_get_ext()` and `x509_crt_get_ext()`.
This renders `mbedtls_x509_get_ext()` unsuitable if it ever
happened that an Extension structure is optional and does not
occur at the end of its surrounding structure, but for CRTs
and CRLs, it's fine.
The following tests need to be adapted:
- "TBSCertificate v3, issuerID wrong tag"
The issuerID is optional, so if we look for its presence
but find a different tag, we silently continue and try
parsing the subjectID, and then the extensions. The tag '00'
used in this test doesn't match either of these, and the
previous code would hence return LENGTH_MISMATCH after
unsucessfully trying issuerID, subjectID and Extensions.
With the new code, any data remaining after issuerID and
subjectID _must_ be Extension data, so we fail with
UNEXPECTED_TAG when trying to parse the Extension data.
- "TBSCertificate v3, UIDs, invalid length"
The test hardcodes the expectation of
MBEDTLS_ERR_ASN1_INVALID_LENGTH, which needs to be
wrapped in MBEDTLS_ERR_X509_INVALID_FORMAT now.
Fixes#2431.
When parsing a substructure of an ASN.1 structure, no field within
the substructure must exceed the bounds of the substructure.
Concretely, the `end` pointer passed to the ASN.1 parsing routines
must be updated to point to the end of the substructure while parsing
the latter.
This was previously not the case for the routines
- x509_get_attr_type_and_value(),
- mbedtls_x509_get_crt_ext(),
- mbedtls_x509_get_crl_ext().
These functions kept using the end of the parent structure as the
`end` pointer and would hence allow substructure fields to cross
the substructure boundary. This could lead to successful parsing
of ill-formed X.509 CRTs.
This commit fixes this.
Care has to be taken when adapting `mbedtls_x509_get_crt_ext()`
and `mbedtls_x509_get_crl_ext()`, as the underlying function
`mbedtls_x509_get_ext()` returns `0` if no extensions are present
but doesn't set the variable which holds the bounds of the Extensions
structure in case the latter is present. This commit addresses
this by returning early from `mbedtls_x509_get_crt_ext()` and
`mbedtls_x509_get_crl_ext()` if parsing has reached the end of
the input buffer.
The following X.509 parsing tests need to be adapted:
- "TBSCertificate, issuer two inner set datas"
This test exercises the X.509 CRT parser with a Subject name
which has two empty `AttributeTypeAndValue` structures.
This is supposed to fail with `MBEDTLS_ERR_ASN1_OUT_OF_DATA`
because the parser should attempt to parse the first structure
and fail because of a lack of data. Previously, it failed to
obey the (0-length) bounds of the first AttributeTypeAndValue
structure and would try to interpret the beginning of the second
AttributeTypeAndValue structure as the first field of the first
AttributeTypeAndValue structure, returning an UNEXPECTED_TAG error.
- "TBSCertificate, issuer, no full following string"
This test exercises the parser's behaviour on an AttributeTypeAndValue
structure which contains more data than expected; it should therefore
fail with MBEDTLS_ERR_ASN1_LENGTH_MISMATCH. Because of the missing bounds
check, it previously failed with UNEXPECTED_TAG because it interpreted
the remaining byte in the first AttributeTypeAndValue structure as the
first byte in the second AttributeTypeAndValue structure.
- "SubjectAltName repeated"
This test should exercise two SubjectAltNames extensions in succession,
but a wrong length values makes the second SubjectAltNames extension appear
outside of the Extensions structure. With the new bounds in place, this
therefore fails with a LENGTH_MISMATCH error. This commit adapts the test
data to put the 2nd SubjectAltNames extension inside the Extensions
structure, too.
All of them are copied from (former) CRT and key files in `tests/data_files`.
For files which have been regenerated since they've been copied to `certs.c`,
update the copy.
Add declarations for DER encoded test CRTs to certs.h
Add DER encoded versions of CRTs to certs.c
fix comment in certs.c
Don't use (signed) char for DER encoded certificates
Consistently use `const char *` for test CRTs regardless of encoding
Remove non-sensical and unused PW variable for DER encoded key
Provide test CRTs in PEM and DER fmt, + pick suitable per config
This commit modifies `certs.h` and `certs.c` to start following the
following pattern for the provided test certificates and files:
- Raw test data is named `NAME_ATTR1_ATTR2_..._ATTRn`
For example, there are
`TEST_CA_CRT_{RSA|EC}_{PEM|DER}_{SHA1|SHA256}`.
- Derived test data with fewer attributes, iteratively defined as one
of the raw test data instances which suits the current configuration.
For example,
`TEST_CA_CRT_RSA_PEM`
is one of `TEST_CA_CRT_RSA_PEM_SHA1` or `TEST_CA_CRT_RSA_PEM_SHA256`,
depending on whether SHA-1 and/or SHA-256 are defined in the current
config.
Add missing public declaration of test key password
Fix signedness and naming mismatches
Further improve structure of certs.h and certs.c
Fix definition of mbedtls_test_cas test CRTs depending on config
Remove semicolon after macro string constant in certs.c
This commit improves hygiene and formatting of macro definitions
throughout the library. Specifically:
- It adds brackets around parameters to avoid unintended
interpretation of arguments, e.g. due to operator precedence.
- It adds uses of the `do { ... } while( 0 )` idiom for macros that
can be used as commands.
* restricted/pr/553:
Fix mbedtls_ecdh_get_params with new ECDH context
Add changelog entry for mbedtls_ecdh_get_params robustness
Fix ecdh_get_params with mismatching group
Add test case for ecdh_get_params with mismatching group
Add test case for ecdh_calc_secret
Fix typo in documentation
* origin/pr/2436:
Use certificates from data_files and refer them
Specify server certificate to use in SHA-1 test
refactor CA and SRV certificates into separate blocks
refactor SHA-1 certificate defintions and assignment
refactor server SHA-1 certificate definition into a new block
define TEST_SRV_CRT_RSA_SOME in similar logic to TEST_CA_CRT_RSA_SOME
server SHA-256 certificate now follows the same logic as CA SHA-256 certificate
add entry to ChangeLog
* restricted/pr/550:
Update query_config.c
Fix failure in SSLv3 per-version suites test
Adjust DES exclude lists in test scripts
Clarify 3DES changes in ChangeLog
Fix documentation for 3DES removal
Exclude 3DES tests in test scripts
Fix wording of ChangeLog and 3DES_REMOVE docs
Reduce priority of 3DES ciphersuites
If mbedtls_ecdh_get_params is called with keys belonging to
different groups, make it return an error the second time, rather than
silently interpret the first key as being on the second curve.
This makes the non-regression test added by the previous commit pass.
Refactor the function mbedtls_asn1_write_bitstring() that removes
trailing 0s at the end of DER encoded bitstrings. The function is
implemented according to Hanno Becker's suggestions.
This commit also changes the functions x509write_crt_set_ns_cert_type
and crt_set_key_usage to call the new function as the use named
bitstrings instead of the regular bitstrings.
In mbedtls_mpi_exp_mod(), the limit check on wsize is never true when
MBEDTLS_MPI_WINDOW_SIZE is at least 6. Wrap in a preprocessor guard
to remove the dead code and resolve a Coverity finding from the
DEADCODE checker.
Change-Id: Ice7739031a9e8249283a04de11150565b613ae89
