The test function generate_random allocated a few extra bytes after
the expected output and checked that these extra bytes were not
overwritten. Memory sanity checks such as AddressSanitizer and
Valgrind already detect this kind of buffer overflow, so having this
test in our code was actually redundant. Remove it.
This has the benefit of not triggering a build error with GCC
(observed with 7.5.0 and 9.3.0) when ASan+UBSan is enabled: with the
previous code using trail, GCC complained about an excessively large
value passed to calloc(), which was (size_t)(-sizeof(trail)).
Thus this commit fixes#4122.
Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
Attempting to create an ECC key with a curve specification that is not
valid can plausibly fail with PSA_ERROR_INVALID_ARGUMENT ("this is not
a curve specification at all") or PSA_ERROR_NOT_SUPPORTED ("this may
be a curve specification, but not one I support"). The choice of error
is somewhat subjective.
Before this commit, due to happenstance in the implementation, an
attempt to use a curve that is declared in the PSA API but not
implemented in Mbed TLS returned PSA_ERROR_INVALID_ARGUMENT, whereas
an attempt to use a curve that Mbed TLS supports but for which support
was disabled at compile-time returned PSA_ERROR_NOT_SUPPORTED. This
inconsistency made it difficult to write negative tests that could
work whether the curve is implemented via Mbed TLS code or via a
driver.
After this commit, any attempt to use parameters that are not
recognized fails with NOT_SUPPORTED, whether a curve with the
specified size might plausibly exist or not, because "might plausibly
exist" is not something Mbed TLS can determine.
To keep returning INVALID_ARGUMENT when importing an ECC key with an
explicit "bits" attribute that is inconsistent with the size of the
key material, this commit changes the way mbedtls_ecc_group_of_psa()
works: it now works on a size in bits rather than bytes, with an extra
flag indicating whether the bit-size must be exact or not.
Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
Test random generation as a whole. This is different from
test_suite_*_drbg and test_suite_entropy, which respectively test PRNG
modules and entropy collection.
Start with basic tests: good-case tests, and do it twice and compare
the results to validate that entropy collection doesn't repeat itself.
Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
This used to be the case a long time ago but was accidentally broken.
Fix <github:nogrep> #4103 for ssl-opt.sh.
Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
Whether MBEDTLS_USE_PSA_CRYPTO is enabled makes a significant
difference with respect to how random generators are used (and, for
no-HMAC_DRBG, how ECDSA signature is dispatched), so test both with
and without it.
Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
Both tests do not require a lot of RAM, even though it may seem
like it at first sight. The derivation output is generated blockwise
from the KDF function, which only keeps state amounting to a couple
of blocks of the underlying hash primitive at a time.
There is never an allocation to keep the full derivation capacity in
memory...
Signed-off-by: Steven Cooreman <steven.cooreman@silabs.com>
With MBEDTLS_USE_PSA_CRYPTO, some of the randomness for the TLS
connection is generated inside the PSA crypto subsystem, which has no
reproducible mode. Whether there is a nonzero amount of randomness
coming from inside the PSA subsystem rather than from the random
generator set by mbedtls_ssl_conf_rng() depends on the choice of
cipher suite and other connection parameters as well as the level of
support for MBEDTLS_USE_PSA_CRYPTO. Rather than give unreliable
results, conservatively abort with a clear error message.
Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
Add doxygen style documentation to `mbedtls_test_fail`, `mbedtls_test_skip`,
`mbedtls_test_set_step` and `mbedtls_test_info_reset`. This should make it
easier to understand how the test infrastructure is used.
Also make some minor style changes to meet the coding standards and make it
more obvious that `mbedtls_test_info.step` was being incremented.
Signed-off-by: Chris Jones <christopher.jones@arm.com>
Add a new function `mbedtls_test_info_reset()` to remove direct writes to
`mbedtls_test_info`. This change still allows values to be read directly
however all writes are now done inside of `helpers.c`.
Also slightly reordered code to make it easier to read.
Signed-off-by: Chris Jones <christopher.jones@arm.com>
Fix some export related tests that were
relying on the fact that the size of the
output buffer was checked after other
parameters.
Signed-off-by: Ronald Cron <ronald.cron@arm.com>
The compilation guards in key_management.c are now
accelerator compilation guards (MBEDTLS_PSA_ACCEL_KEY_TYPE_xyz).
As a consequence when running the PSA driver wrapper
tests as part of test_psa_crypto_config_basic
and test_psa_crypto_drivers all.sh components all
key management cryptographic operations were handled by
the software builtin fallback, and not by the test driver
as intended in the first place.
This commits fixes this issue by:
. declaring an accelerator for ECC key pairs in
test_psa_crypto_config_basic.
. declaring an accelerator for both ECC and RSA
key pairs in test_psa_crypto_drivers.
It is possible to declare an accelerator for both
ECC and RSA key pairs in test_psa_crypto_drivers
and not in test_psa_crypto_config_basic because
in the case of test_psa_crypto_drivers the new
PSA configuration is not activated. That way,
the builtin fallback software implementation
is present to supply the transparent test driver
when some support is missing in it (mainly
RSA key generation).
Note that the declaration of accelerators does
much more than just "fixing" the execution flow of
driver wrapper tests, it makes all import and public
key export cryptographic operations in all unit
tests being handled by the transparent test driver
(provided that it supports the key type).
One test case related to key generation is
partially disabled. This will be fixed with the
rework of psa_generate_key along the lines
described in psa-crypto-implementation-structure.md.
Signed-off-by: Ronald Cron <ronald.cron@arm.com>
In test_suite_psa_crypto_driver_wrappers test suite, the
generate key with software fallback test should be run
only if the software fallback is available.
Signed-off-by: Ronald Cron <ronald.cron@arm.com>
Change key management test driver default forced
return value from PSA_ERROR_NOT_SUPPORTED to
PSA_SUCCESS to be able to run the PSA unit tests
with the cryptographic key management operations
being handled by the transparent test driver.
Signed-off-by: Ronald Cron <ronald.cron@arm.com>
Add ECP/RSA transparent test driver import_key
entry point and use it in the transparent test
driver entry supporting both ECP and RSA.
Signed-off-by: Ronald Cron <ronald.cron@arm.com>
Move key buffer allocation from psa_import_key_into_slot()
function up to the two functions calling it.
Signed-off-by: Ronald Cron <ronald.cron@arm.com>
Rename ECP key import function before to move
it to psa_crypto_ecp.c to adapt to the naming
of exported functions in psa_crypto_ecp.c.
Signed-off-by: Ronald Cron <ronald.cron@arm.com>
Rename psa_import_rsa_key to mbedtls_psa_rsa_import_key to
align its name with the naming conventions of exported
functions in psa_crypto_rsa.c.
Signed-off-by: Ronald Cron <ronald.cron@arm.com>
Add ECP/RSA transparent test driver export_public_key
entry point and use it in the transparent test driver
supporting both ECP and RSA.
Signed-off-by: Ronald Cron <ronald.cron@arm.com>
