If a fallback is not explicitly configured in the
mbedtls_test_rnd_buf_info structure, fail after the buffer is
exhausted.
There is no intended behavior change in this commit: all existing uses
of mbedtls_test_rnd_buffer_rand() have been updated to set
mbedtls_test_rnd_std_rand as the fallback.
Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
Update the mbedtls_test_psa_exercise_key to handle and use
PSA_KEY_USAGE_SIGN_MESSAGE and PSA_KEY_USAGE_VERIFY_MESSAGE key policies.
Add new tests for PSA_KEY_USAGE_SIGN_MESSAGE and PSA_KEY_USAGE_VERIFY_MESSAGE
policies.
Signed-off-by: gabor-mezei-arm <gabor.mezei@arm.com>
Move the key buffer size calculation code under
tests to avoid check-names.sh to complain about
"likely macros with typos".
This removes the calculation of key buffer
sizes for the test driver from the wrapper based on
static size data. But the code is still there in test
code to be used when we go back to work on the
generation of the driver wrapper.
Signed-off-by: Ronald Cron <ronald.cron@arm.com>
Improve comments explaining error code checking, fix incorrect comments
and make a small formatting fix.
Signed-off-by: Chris Jones <christopher.jones@arm.com>
MSVC doesn't like multiple compilation units with the same name.
(conflict between cipher.c in the library and in the test driver folder)
Signed-off-by: Steven Cooreman <steven.cooreman@silabs.com>
Leverage the fact that the get_builtin_key entrypoint returns a key's
attributes, such that a proper size for the builtin key's buffer can
be calculated through the driver's get_key_buffer_size hook.
Signed-off-by: Steven Cooreman <steven.cooreman@silabs.com>
The macro always meant 'location', but was mistakenly named 'lifetime'.
Naming it location instead makes much more sense, and drives home the
conceptual differences between location and lifetime values.
Signed-off-by: Steven Cooreman <steven.cooreman@silabs.com>
Instead of the full attributes struct, it now only takes/returns what it
actually needs to.
Signed-off-by: Steven Cooreman <steven.cooreman@silabs.com>
Builtin key support for the test driver is always compiled in, and no
longer guarded by MBEDTLS_PSA_CRYPTO_BUILTIN_KEYS.
Parsing the key slot from the buffer by cast and assign instead of memcmp.
For exporting keys, the test driver no longer reaches into the key
identifier in order to check whether a key is builtin, but rather
assumes so based on the key buffer length. It's the driver's
responsibility to be able to detect the key material it returned as part
of the get_builtin_key operation.
Signed-off-by: Steven Cooreman <steven.cooreman@silabs.com>
Move to its own file in the test tree, to simplify platform vendors
providing their own implementation.
Signed-off-by: Steven Cooreman <steven.cooreman@silabs.com>
As part of test_psa_crypto_drivers, define a builtin symmetric
plus an ECC key on the test driver lifetime.
Signed-off-by: Steven Cooreman <steven.cooreman@silabs.com>
According to the design in psa-driver-interface.md. Compiles without
issue in test_psa_crypto_drivers.
Signed-off-by: Steven Cooreman <steven.cooreman@silabs.com>
Improve documentation by:
- Fixing off by one errors in binary representations of error codes.
- Clarifying combinations of zero.
- Linking references to variables/macros via doxygen.
Signed-off-by: Chris Jones <christopher.jones@arm.com>
Although not commonly done, it should be possible to add error codes
together even if the high level error code is equal to zero.
Signed-off-by: Chris Jones <christopher.jones@arm.com>
Previously an error message was printed and then the test manually exited
via `mbedtls_exit( 1 )`. This commit includes a rebase onto:
540320bf7b so that `mbedtls_test_fail` can
be used instead to properly fail tests (and report them as such).
Signed-off-by: Chris Jones <christopher.jones@arm.com>
Add new checks and specific error messages to `mbedtls_test_err_add_check`.
This should now catch all types of error when combining error codes and
provide a specific error message to explain what occured.
Signed-off-by: Chris Jones <christopher.jones@arm.com>
`mbedtls_test_err_add_check` was previously incorrectly throwing an error if
both error codes were correct and valid pure error codes. This change fixes
that behaviour to correctly throw errors when invalid combinations are found.
Signed-off-by: Chris Jones <christopher.jones@arm.com>
Adds a macro (`MBEDTLS_ERR_ADD`) to add error codes together and check that the
result will not be corrupted. This additional check is only enabled during
testing when `MBEDTLS_TEST_HOOKS` is defined.
Also includes a reference usage example in `rsa.c` where two high-level error
codes could be incorrectly added together under the right conditions. This now
ensures that when this error occurs during testing it will be correctly
reported.
Signed-off-by: Chris Jones <christopher.jones@arm.com>
Remove cipher_generate_iv driver entry point as there
is no known use case to delegate this to a driver.
Signed-off-by: Ronald Cron <ronald.cron@arm.com>
Make use of psa_cipher_xyz_internal() functions to
simplify the transparent test driver code and
extend the algorithms it supports to all algorithms
supported by the MbedTLS library.
Signed-off-by: Ronald Cron <ronald.cron@arm.com>
Merge the two identical definitions of TEST_USES_KEY_ID and
mbedtls_test_psa_purge_key_storage from
test_suite_psa_crypto_slot_management.function and
test_suite_psa_crypto_se_driver_hal.function into a single copy in
common test code so that it can be used in all test suites.
No semantic change.
Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
mbedtls_test_fail does not copy the failure explanation string, so
passing a string on the stack doesn't work. This fixes a garbage
message that would appear if a test triggered a non-implemented code
path.
More generally, just use TEST_ASSERT instead of explicitly calling
mbedtls_test_fail, since we aren't playing any tricks with the error
location.
Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
